SCANNING ELECTRON MICROSCOPE ( SEM ) ZEISS EVO 10

Model

⦁ Carl Zeıss -EVO 10

APPLICATIONS

⦁ Image analysis and characterization of metallic materials

⦁ Analysis of elemental composition of samples with EDX detector

⦁ Phase, microstructure, inclusion and damage analysis of metallic materials

Standarts

Technical Properties

⦁ Analysis with tungsten filament

⦁ Topographic imaging with secondary electron (SE) detector

⦁ Compositional imaging with a backscattered electron (BSE) detector

⦁ Qualitative and quantitative analysis of chemical composition along point, area or line with EDS detector

⦁ 8.5mm working distance and 25mm2 viewing area

⦁ Sample analysis up to 100mm height and 120mm diameter

⦁ Possibility of coating for insulating samples